Description
Hitachi Information Control Systems (HICSE) is a market driven, growing rail software developer, rich in innovation and diversity in our products, technology, services, and staff.
The rail industry is facing many challenges today, developing rail signaling solutions that can deliver both cost saving efficiencies whilst ensuring that safety is also maintained is critical to the industry’s future.
HICSE is working on the next generation of software products to support the changing world and focusing on the interoperability and accessibility of software to deliver an improved user experience. HICSE’s railway solutions provide support to engineering activities throughout the whole lifecycle of signaling works on one easily accessible, digital platform, allowing users to identify issues earlier in the works saving money.
FIB-SEM systems have become an indispensable tool for characterization and analysis of the latest technologies and high performance nano-scale materials.
An ever-increasing demand for ultrathin TEM lamellas without artifacts during FIB processing require the best in ion and electron optics technologies.
The HITACHI Focused Icon Beam System (FIB) NX-2000 is equipped with three guns. The high current density ion column (up to 100nA) is vertical. The ultra-high resolution electron column has a new generation cold emission gun allowing observation of the thinned area in real time. A third gun emitting Argon ions considerably reduces the radiation damage usually seen with Gallium ions.
The 200mm X 200mm travel stage, the patented “Micro Sampling” device and multiple gas injection possibilities complete the features of the Hitachi NX2000 FIB.
FIB column
- Resolution (SIM): 4 nm 30 kV, 60 nm 2 kV
- Accelerating voltage: 0,5 kV – 30 kV
- Beam current: 0,05 pA – 100 nA
- Max. beam current density: 54 A/cm2
- Aperture: Automated – 15 positions
FE-SEM column
- Resolution: 2,8 nm 5 kV, 3,5 nm 1kV
- Accelerating voltage: 0,5 kV – 30 kV
- Electron source: Cold cathode field emission source
- Real-time monitoring: Optics enabled for live fabrication
- Detector
- Standard detector: Upper/Lower SED & BSED
Stage
- X: 0-205 mm
- Y: 0-205 mm
- Z: 0-10 mm
- θ: 0-360° continuous
- γ: -5 – 60°
